PRELIMINARY REPORT ON THE CONSTRUCTION OF AN APPARATUS FOR HALL EFFECT AND ELECTRICAL CONDUCTIVITY MEASUREMENTS AT LOW TEMPERATURES,

Abstract

The report briefly describes conduction in semiconductors, the effects of electron radiation damage on the electrical properties of semiconductors, and the determination of the radiation damage from conductivity and Hall effect measurements. Design of instruments to measure the Hall coefficient and electrical resistivity of the samples at cryogenic temperatures is discussed.

Document Details

Document Type
Technical Report
Publication Date
Feb 29, 1960
Accession Number
AD0654416

Entities

People

  • T. R. Whyte

Organizations

  • Johns Hopkins University Applied Physics Laboratory

Tags

DTIC Thesaurus Topics

  • Conductivity
  • Electrical Conductivity
  • Electrical Properties
  • Electromagnetic Radiation
  • Hall Effect
  • Low Temperature
  • Measurement
  • Radiation
  • Semiconductors

Fields of Study

  • Materials science
  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Plasma Physics.
  • Software Engineering

Technology Areas

  • Microelectronics