USE OF THE ELLIPSOMETER IN THE MEASUREMENT OF THIN FILMS.
Abstract
Work was performed to outline procedures for use of the ellipsometer in thin film measurement for basic studies on corrosion and corrosion inhibition. The Poincare sphere was used as a geometrical model to analyze ellipsometer readings in terms of polarization forms of light. Changes in polarization form were used to obtain thickness and refractive index of thin films of adsorbed inhibitors or corrosion products. A five-layer barium stearate film and adsorbed monolayers of stearic acid on chrome were measured. Conclusions are that procedures outlined in the report give results consistent with published results. Ellipsometry measures films with thickness of the order of molecular dimensions. Film growth in adsorption and corrosion processes can be observed beginning in their earliest stages.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1967
- Accession Number
- AD0658063
Entities
People
- Bernard J. Bornong