THE EFFECT OF STIFFENING SHALLOW SHELLS OF REVOLUTION SUBJECT TO SYMMETRICAL LOADING,

Abstract

A discussion is presented of the relationship between the stiffening of shallow shells of revolution by stringers in the meridional direction and the stress and strain states in the shells. The case of a frustum of a conical shell with stiffeners in the longitudinal direction is analyzed. The slope angle of the shell varies from zero to pi/6. The shell is considered structurally orthotropic on the basis of known equilibrium equations (in terms of forces and moments) for an element of an axisymmetric shell, elasticity relationships, and equations for continuity of strains in the middle surface. The problem is reduced to the solution of a system of five regular differential equations. The system was integrated by the numerical Adams method on an Ural-2 electronic digital computer. A standard program developed and the Institute of Mechanics of the Academy of Sciences Ukrainian SSR was utilized. The calculations were carried out for frustums of conical shells of constant thickness (plain and stiffened by constant-cross-section stringers). The bottom base of the shells was fixed; the upper was free. Two cases of loading were considered: constant internal pressure and axial force. The results obtained are plotted in diagrams and compared, and the effects of stiffening on certain stress and strain parameters for various slope angles are discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1967
Accession Number
AD0660762

Entities

People

  • A. K. Shulika
  • V. M. Mitkevich

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Axisymmetric
  • Computers
  • Continuity
  • Differential Equations
  • Digital Computers
  • Elastic Properties
  • Equations
  • Internal Pressure
  • Mathematics
  • Mechanics
  • Revolutions
  • Standards
  • Stiffening
  • Thickness

Fields of Study

  • Physics

Readers

  • Structural Dynamics.

Technology Areas

  • Microelectronics