HETEROCRYSTAL INTEGRATED CIRCUIT TECHNIQUES.
Abstract
The report contains a summary of experimental work related to the following topics: (1) Use of aluminum oxide, silicon oxide, and silicon nitride as possible masking materials for selectively etching GaAs and Ge deposition in GaAs; (2) Isolation properties of GaAs sub SI as received from crystal processing and after oxide and germanium growth; (3) Device characteristics of junctions formed in germanium regions selectively grown in germanium and in gallium arsenide substrates. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1967
- Accession Number
- AD0661042
Entities
People
- C. Dennis
- E. Clayton Teague
- L. Sharif
- Stacy B. Watelski
Organizations
- Texas Instruments