NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.

Abstract

Noise measurements in transmission type secondary electron multipliers, image intensifier multipliers and continuous channel electron multipliers indicate that the noise can always be described as the product of the multiplied primary shot noise and a noise deterioration factor. The deterioration factor is comparable in all cases. The first two devices have a linear relative between output and input, but the channel multiplier is nonlinear. One must then distinguish between the true and apparent noise reduction factors. The latter can be quite small and it gives an inflated idea about the multiplier performance. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1967
Accession Number
AD0661640

Entities

People

  • A. Van Der Ziel

Organizations

  • University of Minnesota

Tags

DTIC Thesaurus Topics

  • Contracts
  • Electron Multipliers
  • Electrons
  • Measurement
  • Noise
  • Noise Reduction
  • Shot Noise

Readers

  • Image Processing and Computer Vision.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics