ADVANCED INSTRUMENTAL TECHNIQUES FOR ELECTRON MICROSCOPY.

Abstract

Two recent modifications have improved the photomicrographic quality and increased the versatility of the HU-11 electron microscope. One modification consists of an exposure meter adapted to the electron microscope, and the other modification consists of a method of rapidly and economically replacing wire filaments. These two basic ideas can be applied to other microscopes.

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1967
Accession Number
AD0663232

Entities

People

  • Richard F. Schneidmiller

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Exposure Meters
  • Filaments
  • Microscopes
  • Microscopy
  • Optical Equipment

Readers

  • Software Engineering
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics