ACCURACY OF LATTICE PARAMETER MEASUREMENTS IN A SMALL CRYSTALLOGRAPHIC RESEARCH LABORATORY.

Abstract

An experimental investigation was conducted into the precision and accuracy with which lattice parameters can be determined under realistic operating conditions. The work included precision alignment of x-ray diffractometers. The lattice parameter project of the International Union for Crystallography is described as an introduction to the work. Special problems applying to materials that are highly transparent to x rays are considered. Data reduction by a least-squares computer program is discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1967
Accession Number
AD0663233

Entities

People

  • Gerard M. Wolten

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Accuracy
  • Advanced Materials
  • Biomedical And Dental Materials
  • Buildings And Structures
  • Computer Programs
  • Computers
  • Crystallography
  • Data Reduction
  • Diffractometers
  • Engineered Materials
  • Materials
  • Measurement
  • Metamaterials
  • Precision
  • X Rays

Fields of Study

  • Physics

Readers

  • Aerospace Test and Evaluation
  • Materials Science and Engineering.
  • Systems Analysis and Design