A BAYESIAN RELIABILITY GROWTH MODEL
Abstract
A model is presented for the reliability growth of a system during a test program. Parameters of the model are assumed to be random variables with appropriate prior density functions. Expressions are then derived that enable estimates (in the form of expectations) and precision statements (in the form of variances) to be made of (1) projected system reliability at time tau after the start of the test program; (2) system reliability after the observation of failure data. Numerical examples are presented, and extension to multi-mode failures is mentioned.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1967
- Accession Number
- AD0663279
Entities
People
- Stephen M. Pollock
Organizations
- Naval Postgraduate School