Two Devices for Analysis of Nystagmus

Abstract

Two devices are described which facilitate measurement and analysis of nystagmus. One device requires manual alignment of a crosshair with the nystagmus slope. This process is much faster than unaided manual scoring because (1) the mechanical aid in slope measurement is very effective, (2) time measurement is virtually automatic, and (3) all steps after the crosshair alignment, including tabulation of digital information and plotting of analog information, are accomplished automatically. The second device is a standard recorder with plug-in units for area-summation and timed switching. It is less versatile than the first device, and is not equivalent to advanced electronic computation, but it does provide an immediate analog display and (with a digital voltmeter-printer) an immediate digital display of analyzed nystagmus. Additional operations performed on the output of these devices can provide estimates of the pi/delta time constant and other parameters. Topics discussed include sources of error in rapid processing of nystagmus and advantages of rapid processing for experimental purposes, for pilot evaluation, and for clinical application.

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Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1967
Accession Number
AD0664209

Entities

People

  • Fred Jr E. Guedry
  • Gene T. Turnipseed

Organizations

  • Naval Aerospace Medical Institute

Tags

Communities of Interest

  • Biomedical
  • Materials and Manufacturing Processes
  • Space

DTIC Thesaurus Topics

  • Automatic
  • Aviation Personnel
  • Computers
  • Digital Computers
  • Digital Information
  • Displacement
  • Electronic Circuits
  • Errors
  • Eye
  • Intervals
  • Measurement
  • Motion Sickness
  • Nystagmus
  • Operational Amplifiers
  • Phase Velocity
  • Recording Systems
  • Test And Evaluation

Readers

  • Brain and Cognitive Science; Experimental Psychology; Cognitive Neuroscience
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.

Technology Areas

  • Microelectronics