A METHOD OF FOURIER ANALYSIS OF X-RAY PEAK SHAPES USING ONLY FIRST-ORDER PEAKS.

Abstract

A method of Fourier analysis of x-ray line broadening is presented whereby microstrains, incoherent particle sizes, and stacking fault probabilities can be calculated using only first order peaks. This approach also eliminates errors due to peak truncation and provides a method for accurate determinations of integrated intensities. Calculations based on this method are compared to results obtained using the usual method of multiple orders. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 22, 1968
Accession Number
AD0665784

Entities

People

  • Jerome B. Cohen
  • R. L. Rothman

Organizations

  • Northwestern University

Tags

DTIC Thesaurus Topics

  • Fourier Analysis
  • Intensity
  • Mathematics
  • Particle Size
  • Particles
  • Probability
  • Truncation
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Spectroscopy.
  • Statistical inference.