METRIC INSTABILITY OF AERIAL FILMS,
Abstract
Investigation of the deformations and the thickness variation of a number of aerial films produced in the USSR. As a result of various experiments performed, it is concluded that, when systematic deformation over a grid of coordinate marks with a spacing of 1 cm is eliminated, the residual measurement errors caused by deformation of the aerial film lie between plus or minus 2.0 and 3.5 microns, while their maximum values can reach 10 microns. It is also found that the residual measurement errors due to variation in the thickness of the aerial film, when a grid of coordinate marks 1 cm apart is used to take them into account, amount to 1.0 to 2.5 microns.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 29, 1967
- Accession Number
- AD0666125
Entities
People
- T. P. Budylova
- Yu. M. Fomin
Organizations
- National Air and Space Intelligence Center