RADIATION EFFECTS IN SILICON AND GERMANIUM.

Abstract

The following have been studied and reported: (a) The influence of aluminum on carrier degradation in neutron-irradiated silicon. (b) Dependence of carrier lifetime on excess density for neutron-irradiated silicon. (c) Influence of impurities on carrier removal and annealing in neutron-irradiated silicon in the resistivity range from 0.5 to 50 ohm-cm. (d) Recombination level position from the dependence of lifetime on excess density in n-type germanium following irradiation. (e) Short-term annealing in bulk silicon following pulsed neutron irradiation. (f) Carrier recombination at disordered regions in neutron-irradiated semiconductors. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1967
Accession Number
AD0666220

Entities

People

  • C. A. Germano
  • O. L. Curtis Jr.
  • R. F. Bass

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aluminum
  • Annealing
  • Compound Semiconductors
  • Degradation
  • Electronics
  • Germanium
  • Impurities
  • Neutron Bombardment
  • Radiation
  • Radiation Effects
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics