Free Radical Yields in Polytetrafluoroethylene as the Basis for a Radiation Dosimeter
Abstract
Exposure of polytetrafluoroethylene (PTFE) to ionizing radiation results in chemical degradation of the polymer and formation of long-lived free radicals. The paper describes the use of quantitative measurements of the electron spin resonance (ESR) spectra of the free radical produced in irradiated PTFE to determine radical yields and attempts to correlate these radical yields with the absorbed radiation dose. The experimental results indicate sufficient correlation over the experimental range rad to permit use of PTFE as a passive radiation dosimeter. The advantages inherent in the use of the PTFE dosimeter for the measurement of low energy electromagnetic or particulate radiation are also discussed. Energy deposition as a function of depth from the incident surface can be determined by sectioning of the polymer after irradiation. The resulting dose - depth curves can then be used to obtain spectral and profile data from polychromatic sources.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1968
- Accession Number
- AD0668109
Entities
People
- Henry S. Judeikis
- Herbert Hedgpeth
- Seymour Siegel
Organizations
- The Aerospace Corporation