STUDY OF THERMIONIC CONVERTER ELECTRODE SURFACES USING THE ELECTRON MIRROR MICROSCOPE.

Abstract

Work function differences on polycrystalline tungsten are studied extensively by means of electron mirror microscopy. The Electron Mirror Microscope (EMM) is shown to be a sensitive tool for correlating cesium adsorption with surface defects. EMM image formation is discussed qualitatively. The instrument response to potential gradients was quantitatively measured as a function of EMM parameters. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1968
Accession Number
AD0668530

Entities

People

  • Kent N. Maffitt

Tags

DTIC Thesaurus Topics

  • Adsorption
  • Converters
  • Electrodes
  • Electrons
  • Microscopes
  • Microscopy
  • Polycrystals
  • Thermionic Converters
  • Tungsten
  • Work Functions

Readers

  • Electronics Engineering
  • Nanoscale Plasmonic Nanotechnology
  • Optical Physics and Photonics.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems