A CENTER OF COMPETENCE IN SOLID STATE MATERIALS AND DEVICES
Abstract
The report, for the first semiannual period of contract support, describes technical findings concerned with glass-ceramic dielectrics, semiconducting glasses, electronic and structural properties of semiconductors, near-degenerate pn junctions, and radiation studies on materials. In addition to the reporting of these technical findings, major additions to our experimental capability made during this period are summarized. Two detailed reportings are made concerning structure in glass-ceramic dielectrics: one concerning the kinetics of crystallization, studied by quantitative x-ray diffraction, and the other concerning structural changes resulting from thermal treatment, studied by electron microscopy, x-ray analysis, and dc and ac electrical properties. For semiconducting glasses, correlations are made concerning thermal treatment and structural changes, on the one hand, and dielectric and electronic properties, on the other. Results are reported from two studies aimed toward determining the structure of compound and elemental semiconductors. An expression for the diffusivity-mobility ratio is derived that is valid for degenerate as well as non-degenerate semiconductors, and is used to plot this ratio against carrier concentration. Brief disclosure is made concerning the radiation stability of semiconducting glasses and insulating glass-ceramics.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 10, 1968
- Accession Number
- AD0669580
Entities
People
- Arthur J. Brodersen
- Eugene R. Chenette
- Fred A. Lindholm
- Larry L. Hench
- Robert W. Gould
Organizations
- University of Florida