X-RAY FLUORESCENCE ANALYSIS FOR HAFNIUM AND ZIRCONIUM IN MIXTURES OF THEIR CHLORIDES, CARBIDES, AND OXIDES,

Abstract

An x-ray fluorescence technique for analyses of mixtures of hafnium and zirconium oxides is described. The basic procedures are extended to include mixed carbides and mixed chlorides. The use of the silicon (111) spectrometer crystal effectively eliminates the usual interference of the second-order zirconium K spectrum with the first-order hafnium L spectrum. Good accuracy and precision are obtained in the range from 0.5 to 99.5 wt % ZrO2. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1968
Accession Number
AD0671926

Entities

People

  • J. H. Richardson

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Chlorides
  • Fluorescence
  • Oxides
  • Precision
  • Spectra
  • Spectrometers
  • X Rays
  • Zirconium
  • Zirconium Oxides

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Spectroscopy.