DIGITAL INTEGRATED CIRCUIT COMPATIBILITY STUDY,
Abstract
The report describes a series of tests which were conducted on integrated digital logic devices from seven manufacturers. Examined in this report are NAND gates and flip-flops, and the capability of mixing different brands and different types of logic within the same system. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1968
- Accession Number
- AD0672183
Entities
People
- Leo F. Welsh
Organizations
- Naval Air Warfare Center, Indianapolis