RAMAN SPECTRA OF XEFE2,IRF5 AND XEF2,IF5.
Abstract
In order to assign vibrational frequencies and determine the molecular structures of several newly synthesized XeF2,IrF5 and XeF2,IF5 compounds and complexes, Raman spectra were recorded on these materials using laser excitation. Before the experiments had begun, it was noted that moisture had leaked into the cells and had reacted with the samples, resulting in the formation of a black residue on the exposed surface. Although the samples had these deposits, Raman spectra could be recorded, and several internal and external vibrational frequencies were observed. A time study on the 2:1 adduct of XeF2,IrF5 indicated that decomposition had taken place under the focussed 6328A He-Ne laser light, yielding peaks which were coincident with the 1:1 bands. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1968
- Accession Number
- AD0672585
Entities
People
- George E. Leroi
- K. L. Treuil
- R. E. Miller
Organizations
- Michigan State University