MATHEMATICAL SIMULATION OF THE EFFECTS OF IONIZING RADIATION ON SEMICONDUCTORS,

Abstract

The report outlines the results of four mathematical investigations initiated during the present contract period: the high-low semiconductor junction, the junction field-effect transistor, the measurement of impurity atom distributions by differential capacitance techniques, and the electrical properties of a diffused semiconductor resistor. Two of these investigations remain incomplete; therefore, the information presented here constitutes a status report for these projects. The remaining two projects have been completed, and the information presented here summarizes all final conclusions derived from these mathematical investigations. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1968
Accession Number
AD0673367

Entities

People

  • David P. Kennedy

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitance
  • Electrical Impedance
  • Electrical Properties
  • Electromagnetic Radiation
  • Field Effect Transistors
  • Ionizing Radiation
  • Radiation
  • Semiconductor Devices
  • Semiconductor Junctions
  • Semiconductors
  • Transistors

Fields of Study

  • Materials science

Readers

  • Adaptive Control and Estimation with Uncertainty in Dynamic Systems.
  • Business Analytics
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics