STUDYING OXIDE CERAMICS BY THE HIGH TEMPERATURE ROENTGENOGRAPHY METHOD (ISSLEDOVANIE OKISNOI KERAMIKI METODOM VYSOKOTEMPERATURNOI RENTGENOGRAFII),

Abstract

A description is given of high-temperature attachments for x-ray diffraction studies with photo- and ionization recording of the diffraction pattern (at temperatures between 20 and 1500C). Examples of high-temperature x-ray analyses are given for sintered oxide materials: CeO2, CeO2-SrO, ZrO2-Y2O3, ZrO2-Nd2O3, ZrO2-CaO. The transitions occurring in ZrO2-Nd2O3 and ZrO2-Y2O3 on heating and cooling are determined. The x-ray coefficients of thermal expansion of these samples are found to be lower than the dilatometric ones. It is postulated that the difference in the change of the lattice constant of CeO2 as studied in air and vacuum is due to the formation of a solid solution of Ce2O3 in a vacuum. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 20, 1967
Accession Number
AD0673393

Entities

People

  • A. F. Bessonov
  • G. V. Burov
  • V. M. Ustyantsev
  • V. N. Strekalovskii

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Advanced Materials
  • Attachment
  • Coefficients
  • Diffraction
  • Engineered Materials
  • High Temperature
  • Ionization
  • Materials
  • Radiography
  • Solid Solutions
  • Thermal Expansion
  • Transitions
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science
  • Physics

Readers

  • Information Retrieval
  • Materials Science and Engineering.
  • Thin Film Deposition Science.