APPLICATIONS OF EXTREME VALUE THEORY IN THE RELIABILITY ANALYSIS OF NON- ELECTRONIC COMPONENTS

Abstract

Manufacturers of non-electronic components and systems are required to accurately determine the reliability of their products in order to meet the demands of government weapon system contracts, safety programs and commercial product warranties. In an effort to establish simple but accurate techniques for determining reliability factors of mechanical components, increased use of statistical theory is being made in analyzing component failure data. This thesis illustrates the application of extreme value theory in the reliability analysis of mechanical systems and components. The basic theory of extreme values is presented and the exact and asymptotic forms of the extreme value distributions are developed. Applications of the extreme value distributions are presented in example problems. The Type I extreme value distribution is applicable to the analysis of corrosive pitting of aluminum and the analysis of maximum loads. The Type III extreme value distribution is useful in the failure analysis of step motors, automobile door lock mechanisms, corrosion resistance of magnesium, automobile structural components and electromagnetic relays.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1967
Accession Number
AD0675545

Entities

People

  • Cletus B. Kuhla

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Ground and Sea Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Brushless Dc Motors
  • Data Mining
  • Data Science
  • Electronic Components
  • Electronics Industry
  • Engineering
  • Information Science
  • Probability Density Functions
  • Probability Distributions
  • Quality Control
  • Random Variables
  • Reliability
  • Statistical Analysis
  • Statistical Distributions
  • Surveys
  • Test And Evaluation

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Life Cycle Cost Analysis
  • Statistical inference.

Technology Areas

  • Microelectronics