ANALYTICAL TECHNIQUES FOR THE DETERMINATION OF TRACE IMPURITIES IN CADMIUM SULFIDE.

Abstract

Mass spectrographic techniques were developed for the analysis of all II-VI compounds. The detection limits for most impurities are less than 10 parts per billion atomic. Covered in detail are new techniques which significantly reduced the time required to perform analyses as compared to work performed under a prior contract. A total of 286 samples were analyzed. Primary interest was in the analysis of all forms of CdS, CdSe, ZnS, ZnSe, and other II-VI compounds. Extensive work was performed in the area of selective ionization of atoms by the spark source mass spectrometer. Studies were also made covering the effects of residual gases in the source of the mass spectrometer on analyses for O, C, N, and H. Automatic exposure equipment, multiple sample holders, and special sample holders and their value with relation to this work is discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1968
Accession Number
AD0676043

Entities

People

  • A. J. Socha
  • R. K. Willardson

Tags

DTIC Thesaurus Topics

  • Automatic
  • Chemical Compounds
  • Communication Equipment
  • Compound Semiconductors
  • Contracts
  • Coverings
  • Detection
  • Electronic Equipment
  • Electronics
  • Impurities
  • Ionization
  • Mass Spectrometers
  • Residuals
  • Semiconductors
  • Solid State Electronics
  • Spectrometers

Readers

  • Combustion science or combustion engineering.
  • Materials Science and Engineering.
  • Systems Analysis and Design