ESTIMATION FROM ACCELERATED LIFE TESTS

Abstract

Presented is a statistical technique for analyzing life test data from tests under overstress conditions. Usually the analyst simply assumes that the accelerated and normal use failure distributions belong to specified parametric families, such as the exponential distribution, and that the test experience is a scale transformation of reality. The new technique assumes only that (1) the failure rate is increasing on the average, and (2) test items in the overstress environment tend to fail sooner than those in normal use. Some data from the use environment are required, but may be scanty. Least squares estimators for the life distributions are developed, using both sets of data; quadratic programming may be used for computation. Procedures are given to test the validity of the assumptions used.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1968
Accession Number
AD0676261

Entities

People

  • Ernest M. Scheuer
  • Richard E. Barlow

Organizations

  • RAND Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Pressure
  • Ball Bearings
  • Bearings
  • Capacitors
  • Computer Programming
  • Computer Programs
  • Data Science
  • Distribution Functions
  • Environment
  • Information Science
  • Life Tests
  • Order Statistics
  • Probability Distributions
  • Random Variables
  • Reliability
  • Statistical Tests
  • Statistics

Fields of Study

  • Mathematics

Readers

  • Software Engineering
  • Statistical inference.
  • Systems Analysis and Design