X-RAY STUDY OF DEFORMATION IN METALS AND ALLOYS.

Abstract

Investigations have shown that an analysis of the x-ray powder pattern peaks provides a tool to study the defect structure of crystalline materials; allowing the determination of applied or residual stresses, stacking fault probabilities, the mean square strain, and the effective particle sizes which contain the true sizes of the coherently diffracting domains and the stacking fault probabilities. This method is particularly suited for applications where transmission electron microscopy cannot be applied easily. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1968
Accession Number
AD0677293

Entities

People

  • Christian N. J. Wagner

Organizations

  • Yale University

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Advanced Materials
  • Electron Microscopy
  • Electrons
  • Engineered Materials
  • Materials
  • Microscopy
  • Optical Analysis
  • Particle Size
  • Particles
  • Probability
  • Residual Stress
  • Residuals
  • Transmission Electron Microscopy
  • X Rays

Readers

  • Computational Modeling and Simulation
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics