A HIGH PURITY REACTION GAS SYSTEM FOR FIELD EMISSION AND IONIZATION MICROSCOPES.

Abstract

A reaction gas system capable of supplying high purity oxygen in the form of a molecular beam to a combined field ion-emission microscope is described. Gas pressure at the emitter could be continuously varied from .001 to 0.000000001 torr. The construction, operation, and calibration of the system are discussed. Also included is a brief discussion of an interrupted time sequence technique used to study oxidation reactions at temperatures from 30 to 900C. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1969
Accession Number
AD0681089

Entities

People

  • Conrad J. Polk
  • Paul Gordon

Organizations

  • Illinois Institute of Technology

Tags

DTIC Thesaurus Topics

  • Calibration
  • Chemical Reactions
  • Construction
  • Electron Emission
  • Emission
  • Emitters
  • Field Emission
  • Ionization
  • Microscopes
  • Molecular Beams
  • Oxidation
  • Sequences

Fields of Study

  • Physics

Readers

  • Combustion science or combustion engineering.
  • Electrical Engineering
  • Semiconductor Device Technology