THE MEASUREMENT OF SEMICONDUCTOR PHOTOCONDUCTIVITY AT SUPERHIGH FREQUENCIES,

Abstract

After pointing out that the microwave method of measuring photoconductivity has many features in common with the method of investigating electron paramagnetic resonance, the author derives relations connecting the parameters of the resonator with the parameters of the photoconducting sample placed in the resonator and illuminated with light. The conditions corresponding to optimal sensitivity of this method of photoconductivity measurement are derived. Formulas that permit the quantitative calculation of the photoconductivity by the resonator method are derived. The relations derived are valid for an arbitrary character of light absorption, but with the diffusion of the photoexcited carriers neglected. Working formulas are derived for a measuring circuit using transmission through a resonator. All the derivations are valid in the small-perturbation approximation.

Document Details

Document Type
Technical Report
Publication Date
Mar 11, 1968
Accession Number
AD0682789

Entities

People

  • E. Z. Meilikhov

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Electron Paramagnetic Resonance
  • Frequency
  • Measurement
  • Paramagnetic Resonance
  • Photoconductivity
  • Resonance
  • Resonant Frequency
  • Resonators
  • Semiconductors
  • Superhigh Frequency

Readers

  • Calculus or Mathematical Analysis
  • Electronics Engineering
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics