MINORITY CARRIER LIFETIME IN SILICON CARBIDE BY THE ELECTROLUMINESCENCE METHOD,

Abstract

A method for determining the minority carrier lifetime by the injection electroluminescence at point contacts is presented. The principles involved and the measuring equipment used are described. Experiments on some important factors such as resonance disturbance, electrical properties and electroluminescence characteristics of the point contacts were performed. Some feasible precautions that must be taken in order to avoid resonance disturbance and contact by-passing and to control the rectification ratios are described. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1968
Accession Number
AD0682804

Entities

People

  • Tam Hoa-yen
  • Ton Fu-di
  • Woo Dau-wei
  • Yui Shou-dung

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Carbides
  • Compound Semiconductors
  • Electrical Properties
  • Electroluminescence
  • Electronic Equipment
  • Electronics
  • Minority Groups
  • Resonance
  • Silicon
  • Silicon Carbide
  • Solid State Electronics

Readers

  • Electrical Engineering
  • Molecular Photonics/Laser Physics
  • Systems Analysis and Design