RANDOM WEAR MODELS IN RELIABILITY THEORY.
Abstract
Gaver and Antelman and Savage have proposed models for the distribution of the time to failure of a simple device exposed to a randomly varying environment. Each model represents cumulative wear as a specified function of a nonnegative stochastic process X with independent increments, and assumes the reliability of the device is conditioned upon realizations of this process. From these models are derived the corresponding unconditional joint distributions for the random failure time vector of n independent, identical devices exposed simultaneously to the same realization of the wear process. Conditions are given under which both models can give rise to identical one-dimensional failure time distributions. Joint failure time distributions are obtained in explicit form and the probabilities of ties and tie configurations are derived. Maximum likelihood estimates are obtained for certain relevant parameters for each of the models when X(t) is a process with stationary nonnegative increments.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1969
- Accession Number
- AD0685596
Entities
People
- David S. Reynolds
Organizations
- Florida State University