GENERATION OF DIAGNOSTIC TESTS USING PRIME IMPLICANTS,
Abstract
With recent advances in microminiaturization and fabrication techniques, digital computer design has begun to make fuller use of single packages containing many logic gates. This change in design approach has shifted the emphasis in fault testing techniques. Fault Testing is defined here as the process of determining whether or not a package of gates is operating correctly by comparing its output under certain inputs with that of the fault-free machine. It is the purpose of this thesis to present an approach to fault testing using only the prime implicant information provided for the system. This technique is an answer to the question, 'How may fault tests for a given circuit be selected with the minimum of detailed analysis of the logic network.' The number of tests specified by this approach is, in general, much lower than the number of possible input combinations, although it may be higher than the minimum number of tests which could be derived with full, detailed knowledge of the circuit structure. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1969
- Accession Number
- AD0688832
Entities
People
- Michael Reid Paige
Organizations
- University of Illinois Urbana–Champaign