LOW TEMPERATURE THERMAL EXPANSION OF WURTZITE-PHASES OF IIB-VIB COMPOUNDS.

Abstract

Thermal expansions of wurtzite, ZnS, and of the wurtzite phase of CdSe were determined by measuring the lattice parameters over the temperature range 2K to about 350K. X-ray powder diffraction film methods with a Van Arkel 34-cm-diam back-reflection camera were used. Camera design and calculation methods are given in Appendices. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1969
Accession Number
AD0691063

Entities

People

  • Robert Richard Reeber

Organizations

  • Ohio State University

Tags

DTIC Thesaurus Topics

  • Diffraction
  • Low Temperature
  • Reflection
  • Thermal Expansion
  • X Rays

Readers

  • Geodesy
  • Materials Science and Engineering.