IONIZATION CURVES FOR SECONDARY IONS IN MASS SPECTROMETER ION SOURCES,

Abstract

An automatic version of the R.P.D. (Retarding Potential Difference) method was developed for obtaining digital ionization curves of secondary ions by using counting techniques and a multi-channel analyzer. The application of an indirectly heated sintered Nickel cathode yielded ca. 40 percent of the total electron current within an energy range of 0.1 eV. The R.P.D. ion source in connection with the automation circuit and a conventional mass spectrometer were used to investigate the formation of KrD(+) ions in Kr-D2 mixtures. It is shown that besides the well known reaction Kr(+) + D2 yields KrD(+) + D the complementary reaction D2(+) + Kr yields KrD(+) + D contributes considerably to the KrD(+) yield. A rather small contribution of the neutral reaction Kr(*) + D2 yields KrD(+) + D + e(-), found earlier by Hotop, could be confirmed. Strong evidence was found for the existence of a reaction path D2(*) + Kr yields KrD(+) + D + e(-) by longlived exited states of D2 above the first ionization limit of D2. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1969
Accession Number
AD0692763

Entities

People

  • U. Lauterbach

Organizations

  • Air Force Cambridge Research Laboratories

Tags

DTIC Thesaurus Topics

  • Analyzers
  • Automatic
  • Automation
  • Charged Particles
  • Electrons
  • Germany
  • Ion Sources
  • Ionization
  • Ions
  • Mass Spectrometers
  • Spectrometers
  • West Germany

Readers

  • Mathematics or Statistics
  • Mycotoxin ecology in Amazonian ecosystems.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics