CALCULATION OF THE RELIABILITY OF LOGIC UNITS DESIGNED WITH CONTACTLESS STANDARD ELEMENTS,

Abstract

Contactless magnetic-and-semiconductior ELM-50, ELM-400, and ET elements have been extensively used in Soviet industrial automatic systems. The article presents a method of calculation of the malfunction probability of these elements and also of a 3-phase automatic circuit recloser designed with these elements.

Document Details

Document Type
Technical Report
Publication Date
Jun 20, 1969
Accession Number
AD0693395

Entities

People

  • O. A. Sedykh
  • V. A. Khrustalev

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Automatic
  • Malfunctions
  • Performance (Engineering)
  • Probability
  • Reliability
  • Standards

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Computer Engineering
  • Electrical Engineering