IMAGE FORMATION IN THE PHILIPS EM-300: AS APPLIED TO ELECTRON DIFFRACTION CONTRAST EXPERIMENTS,

Abstract

This paper illustrates some geometrical considerations related to image formation in the electron microscope, how the sense of the specimen tilt can be defined and applied to electron diffraction contrast experiments. The discussion is based upon the Philips EM-300, however, the use of diffraction patterns to define the sense of specimen tilt is generally applicable. The potential of stereomicroscopy as an aid to the analysis of contrast results is discussed briefly. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1969
Accession Number
AD0694305

Entities

People

  • A. K. Eikum

Organizations

  • Boeing

Tags

DTIC Thesaurus Topics

  • Contrast
  • Diffraction
  • Electron Diffraction
  • Electron Microscopes
  • Electrons
  • Microscopes
  • Optical Equipment
  • Optical Magnification Devices
  • Wave Phenomena

Readers

  • Business Analytics
  • Image Processing and Computer Vision.
  • Nanoscale Plasmonic Nanotechnology

Technology Areas

  • Microelectronics