LOW-VALUE TANTALUM THIN-FILM RESISTORS,

Abstract

Low value resistors were fabricated with mean values within about 10 percent of design and with confidence limits (2 sigma) within about plus or minus 20 percent of the mean, which compare favorably with the results previously reported on tantalum thin-film resistors greater than 3.3 kohms. The best resistors were designed with parallel elements having 1/2-mil line widths and an aspect ratio (length/width) of 4. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1969
Accession Number
AD0695673

Entities

People

  • Albert D. Bender
  • Stuart I. Lieberman

Organizations

  • Harry Diamond Laboratories

Tags

DTIC Thesaurus Topics

  • Aspect Ratio
  • Confidence Limits
  • Electronic Components
  • Electronic Equipment
  • Elements
  • Film Resistors
  • Films
  • Fixed Resistors
  • Passive Electronic Components
  • Resistors
  • Tantalum
  • Thin Film Resistors
  • Thin Films

Readers

  • Electrical Engineering
  • Systems Analysis and Design