COMPUTER-AIDED TECHNIQUE FOR THE ACCURATE DETERMINATION OF THE SEMICONDUCTOR IMPURITY DOPING PROFILE.

Abstract

The basic equations for the determination of semiconductor net impurity doping profiles are derived. A computer technique is introduced which aids the accurate solution of the basic equations. The described method is mathematically rigorous and represents a vast improvement over previously used techniques. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1969
Accession Number
AD0697127

Entities

People

  • Joseph J. Baranowski
  • Vincent J. Higgins

Organizations

  • United States Army Communications-Electronics Command

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Computers
  • Electronics
  • Equations
  • Impurities
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Semiconductors
  • Solid State Electronics

Readers

  • Calculus or Mathematical Analysis
  • Spectroscopy.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics