THE TEMPERATURE DEPENDENCE OF THE THERMAL CONTACT RESISTANCE ACROSS NONMETALLIC INTERFACES

Abstract

Extensive measurements of thermal contact resistance were conducted in the following study areas, where no previous systematic measurements have been performed: (1) interfaces consisting of brittle, nonmetallic components, and (2) radiative transport across the interface at high temperatures. An apparatus for performing the measurements to elevated temperatures was designed, constructed, and performance tested. The equipment, operated in vacuum environments, utilized tantalum heaters to develop heat flow down a specimen column which was water cooled at its base. The contact resistance specimen column consisted of two high purity beryllium oxide cylinders, 1 inch in diameter and 1.5 inches in length. The successful performance of the apparatus was demonstrated by measuring the thermal conductivity of beryllium oxide and tantalum as a function of temperature. Analytical predictions of heat losses from the specimen column were made through solution of the boundary-value problem for the temperature field in the insulation segment surrounding this column. The results compared favorably with experimental heat loss measurements.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1969
Accession Number
AD0697988

Entities

People

  • Merrill L. Minges

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Computational Science
  • Conductivity
  • Differential Equations
  • Finishes
  • Geometry
  • Heat Transfer
  • Heat Transfer Coefficients
  • Heat Transmission
  • High Temperature
  • Materials Laboratories
  • Measurement
  • Physical Properties
  • Surface Properties
  • Surface Roughness
  • Thermal Conductivity
  • Thermal Resistance

Readers

  • Thermal Physics or Thermal Science.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics