ELECTRICAL NOISE IN GaAs DIODE LASERS.
Abstract
Measurements were made of the current fluctuations at 30 MHz generated in a GaAs diode during luminescent and lasing operation. It was found that thermal noise predominates over other effects. Calculations indicate that this dominance is due to the small junction resistances which occur at helium temperatures. In addition, the line loss in the transmission system was found to limit the measurement system sensitivity. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 30, 1969
- Accession Number
- AD0698281
Entities
People
- T. Robert Royt
Organizations
- United States Naval Research Laboratory