ELECTRON MEAN FREE PATH NEAR 2 keV IN ALUMINUM,

Abstract

The mean free path for elastic scattering and for plasmon production was determined from beam attenuation measurements on films of various thicknesses. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1969
Accession Number
AD0698746

Entities

People

  • Helmut Kanter

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Aluminum
  • Attenuation
  • Elastic Scattering
  • Electrons
  • Inelastic Scattering
  • Mean Free Path
  • Measurement
  • Nuclear Reactions
  • Nuclear Scattering
  • Production
  • Scattering
  • Thickness

Fields of Study

  • Physics

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene