THE SCANNING ELECTRON MICROSCOPE AND ITS APPLICATIONS IN FRACTURE STUDIES OF COMPOSITE MATERIALS,

Abstract

The principles of operation of the scanning electron microscope are discussed. Detail is given concerning the formation and collection of the various types of emissions arising from electron beam bombardment of solid specimens. Applications of the SEM in fracture studies of composite materials are reviewed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 10, 1969
Accession Number
AD0699140

Entities

People

  • James V. Larsen

Organizations

  • Naval Ordnance Laboratory

Tags

DTIC Thesaurus Topics

  • Composite Materials
  • Electron Beams
  • Electron Microscopes
  • Electrons
  • Emission
  • Materials
  • Microscopes
  • Optical Equipment
  • Optical Magnification Devices
  • Scanning
  • Scanning Electron Microscopes

Readers

  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.
  • Systems Analysis and Design

Technology Areas

  • Directed Energy
  • Microelectronics