LUMPED MODELS OF BIPOLAR TRANSISTORS AND EVALUATION OF THEIR PARAMETERS.

Abstract

An analysis of several methods for determining experimentally the 'lumped model' parameters of bipolar transistors is presented. All practical problems involved in the measurements are discussed and as a consequence the most appropriate method is suggested as a guide line. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1969
Accession Number
AD0700258

Entities

People

  • Hilton Andrade De Mello

Organizations

  • Stanford University

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Bipolar Junction Transistors
  • Electronic Components
  • Electronic Equipment
  • Electronics
  • Measurement
  • Test And Evaluation
  • Transistors

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Semiconductor Device Technology
  • Systems Analysis and Design