INITIAL STUDY FOR THE DEVELOPMENT OF A RELIABILITY-PREDICTION TECHNIQUE FOR MONOLITHIC INTEGRATED CIRCUITS,

Abstract

The report presents the results of a study to determine the feasibility of developing a reliability-prediction technique for integrated circuits. The proposed prediction technique is intended to be based upon statistical analysis of data collected from manufacturers and users of integrated circuits. The principal aim of the study described here was to determine whether the proposed prediction technique can be supported by the integrated-circuit reliability data that have been recorded and retained by organizations involved in integrated-circuit applications. A list of the significant reliability-influencing variables was prepared and the feasibility of developing prediction equations based on a regression analysis of these variables from the data available has been established. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1969
Accession Number
AD0702400

Entities

People

  • E. W. Dishman
  • J. D. Reese
  • S. S. Schneider

Organizations

  • ARINC

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuits
  • Data Analysis
  • Data Science
  • Information Science
  • Integrated Circuits
  • Regression Analysis
  • Reliability
  • Statistical Analysis

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Regression Analysis.
  • Systems Analysis and Design