PHYSICAL CHARACTERIZATION OF ELECTRONIC MATERIALS, DEVICES AND THIN FILMS

Abstract

Experimental methods include chemical analysis, reflection electron diffraction, X-ray diffraction and fluorescence analysis, light microscopy and electron probe microanalysis, in addition to the determination of specific properties, such as density, hardness and thermal conductivity. Special services such as crystal orientation, cutting, grinding and polishing, are also being performed. Specific materials submitted for characterization include spinel, cobalt, silicide, lithium germanate, silicon, mercury sulfide, cadmium sulfide, silicon carbide, quartz, ruby, calcite, magnesium oxide, cesium copper chloride, gallium arsenide, boron, potassium tantalum niobate, alundum, yttrium-iron garnet, yttrium-aluminum gasket, germanium and lithium niobate. In addition, a variety of specimens were submitted for specific studies such as phase identification, crystallinity and chemical analysis. High pressure experiments were carried out on Al-S and Al-Se alloys to produce tetrahedral, unsymmetrical Group IV analogs. Two new compounds, delta Al2S3 and delta Al2Se3, were synthesized at pressures of 7 to 50 Kb at temperatures of 800 to 875C. Both compounds have the cubic defect spinel structure of alpha Al2O3. The synthesis experiments pointed out the presence of tetrahedral-to-octahedral coordination densification transformations which compete with the high pressure synthesis of new tetrahedral Group IV analog compounds.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1970
Accession Number
AD0703275

Entities

People

  • Edward T. Peters
  • Edward V. Clougherty
  • Konstantin Kreder
  • S. A. Kulin

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Air Force
  • Artificial Intelligence
  • Chemical Analysis
  • Chemical Synthesis
  • Chemistry
  • Compound Semiconductors
  • Diffraction
  • Electron Diffraction
  • Electron Probes
  • High Pressure
  • Materials
  • Measurement
  • Microscopy
  • Silicon Carbide
  • Thermal Conductivity
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics