RELIABILITY EVALUATION OF PLASTIC INTEGRATED CIRCUITS.
Abstract
The production of plastic-encapsulated integrated circuits for military applications are investigated and methods and techniques for assessing and assuring the reliability of such circuits are developed. A series of screens and tests are being performed on selected circuits, and detailed failure analyses are being performed to determine the failure modes and mechanisms characteristic of the various types of plastic encapsulations. The results to date have indicated contrasts in performance between package types and between screened and unscreened groups, as well as significant lot-to-lot variations. Several tentative conclusions have been drawn based on test results to date. (Author, modified-PL)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1970
- Accession Number
- AD0703292
Entities
People
- David R. Little
- John R. Bevington
Organizations
- General Motors