PRECISION MEASUREMENT OF THE FREQUENCY AGING OF QUARTZ CRYSTAL UNITS.
Abstract
A system to determine the aging rate (frequency change with time) of quartz crystal units of the type used in single-sideband ratio sets is described. These quartz crystal units have an aging rate of the order of 10 to the minus 8th power/week. The temperature stability of ovens and frequency stability of test oscillator circuits are discussed. Performance data of several kinds of quartz crystal units are included. The control of power line voltage and room temperature is shown to be necessary for reliable measurements with a precision of 1 x 10 to the minus 9th power. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1970
- Accession Number
- AD0703841
Entities
People
- Marvin Bernstein
Organizations
- United States Army Communications-Electronics Command