WAVEGUIDE TESTING WITH NANOSECOND R-F VOLTAGE PULSES.
Abstract
The testing of waveguide systems was demonstrated using nanosecond r-f pulses. Pulse generation was effected by d-c coupled pulse grid modulation of a traveling-wave tube. This d-c modulation pulse was produced through the use of a fast thyratron circuit. Resultant r-f voltage pulses were used to drive a waveguide system and reflections from waveguide obstructions were viewed on a high-speed sampling oscilloscope. The location and reflection coefficients of obstructions were then obtained from measurements taken on the oscilloscope face. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1969
- Accession Number
- AD0704526
Entities
People
- William Carl Schmidt
Organizations
- Naval Postgraduate School