SENSITIVITY ANALYSIS OF NONLINEAR CIRCUITS.
Abstract
The use of the digital computer for the simultaneous generation of circuit responses and their corresponding sensitivity to parameter changes is considered for circuits containing diodes and transistors. Modeling of the diodes and transistors is based upon the Ebers-Moll equations, with the addition of voltage-dependent capacitors to account for switching time. The resulting general iterative equations are then used to calculate the effects of radiation on a p-n junction. The waveforms and circuit recovery time are studied as a function of circuit parameters. The use of sensitivity functions for predicting waveform variations is considered. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1969
- Accession Number
- AD0705103
Entities
People
- Ronald Alvin Lee
Organizations
- Naval Postgraduate School