ELECTRON PROBE ANALYSIS OF SEMICONDUCTORS.

Abstract

The report summarizes the research in electron probe analysis of semiconductors performed under the grant. Contributions have been made in the following areas: (1) x-ray generation and absorption in electron probe analysis, (2) electron beam modulated optical properties of semiconductors, (3) electron spectrometry with the transmission electron microscope, and (4) cathodoluminescence of semiconductors. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1970
Accession Number
AD0705251

Entities

People

  • David B. Wittry

Organizations

  • University of Southern California

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Electron Beams
  • Electron Microscopes
  • Electron Probes
  • Electrons
  • Microscopes
  • Optical Properties
  • Probes
  • Semiconductors
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology
  • Technical Research and Report Writing.

Technology Areas

  • Directed Energy
  • Microelectronics