SYNTHESIS AND CHARACTERIZATION OF THIN FERROELECTRIC AND SEMICONDUCTING FILMS.

Abstract

The results of a series of electrical measurements on thin TiO2 films are described herein. Such films consistently show a negative resistance effect when noble metal electrodes are placed in contact with them. The major portion of this technical report is concerned with ion implantation of single crystal cadmium sulfide. The experimental program studied the effects of group V implants. It was found that bismuth implantations type converted CdS from its natural n-type state. P-n junctions were constructed and room temperature light emission was observed in the forward biased mode. Some of the aspects of low energy ion implantation (25-50 keV) were investigated such as penetration depth and damage. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1970
Accession Number
AD0706097

Entities

People

  • Fred Chernow

Organizations

  • University of Colorado Boulder

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Electrical Measurement
  • Films
  • Implantation
  • Ion Implantation
  • Ions
  • Measurement
  • P-N Junctions
  • Semiconducting Films
  • Semiconductors
  • Single Crystals

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Thin Film Deposition Science.