OPTIMAL PROPERTIES AND ELECTRONIC STRUCTURE OF METALS AND SEMI-METALS.
Abstract
Normal incidence reflectivity techniques at a metal-dielectric interface have been worked out for liquid and single crystal samples in the energy range 0.5 to 10 eV. Reflectivity measurements at 10 angles of incidence, at a given wavelength and at a metal dielectric interface, with light parallel and perpendicular to the plane of incidence were performed. The optical constants (n,k) so obtained are only of fair accuracy. On the other hand, ellipsometric measurements on liquid and cubic metals, at the dielectric-metal interface, give fairly accurate values of n,k. Difficulties arise for non-cubic metals. Normal incidence (about 7 degrees) reflectance measurements and ellipsometric measurements were performed on single crystal and liquid Hg in contact with dielectric windows (MgF2 and SiO2 respectively) for the energy range 0.5 to 10.0 eV. In the energy range 0.5 to 2.0 eV the reflectivity of the solid andliquid are not at all similar. Above 2 eV the solid and liquid reflectance values are of similar magnitude. The solid has considerably more structure in the reflectance. Values of the optical constants have been obtained by means of a least square fit of the data through the use of a Drude term plus a sum of damped oscillators for the dielectric function. The data is interpreted qualitatively in terms of band structure. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 20, 1970
- Accession Number
- AD0707550
Entities
People
- Seymour H. Vosko
- Wolfgang J. Choyke