SCANNING ELECTRON MICROSCOPY OF 6309 SIZE BEARINGS.

Abstract

The present research program is primarily concerned with a thorough study of bearing surfaces, both before and after running, with scanning electron microscopy (SEM) techniques. The SEM is a relatively new research tool whose application should lead to a much better characterization of surface initiated failure processes. Furthermore, since large surface areas can be conveniently studied, a more valid representation of bearing surfaces and their modifications with running should be obtained. This report covers the first phases of this research program. After a brief introduction on the SEM, a series of representative micrographs will be presented and briefly described. Then a discussion of the results to date will be presented. Finally, there will be an outline of further work on this current research program. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 31, 1970
Accession Number
AD0709462

Entities

People

  • Gerald Cotellesse
  • Laurence Leonard

Tags

DTIC Thesaurus Topics

  • Electron Microscopy
  • Electrons
  • Microscopy
  • Optical Analysis
  • Scanning
  • Scanning Electron Microscopy

Readers

  • Business Analytics
  • Materials Science (Mechanical Engineering).
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems